The Advanced Electrical Characterization Lab (AECL), located in NSERL (RL 4.504), is a core facility operated and maintained by the Office of Research and Innovation. This lab is equipped with instrumentation for the electrical characterization of devices and structures on wafers and substrates (up to 200 mm diameter) over a temperature range of -65 to 200 °C. The Cascade probe station is specified to provide current measurement down to fA and capacitance measurement down to tens of fF. For capacitance-voltage (C-V) and current-voltage (I-V) measurements, the lab is equipped with a Keithley 4200-SCS (Semiconductor Characterization System), Agilent 4284, and Agilent 4155. Using the probe station in conjunction with appropriate test equipment coupled with analysis, specific electrical properties of thin-films and devices can be probed to understand device performance and reliability.
Contact
Please contact Dr. Chadwin Young by emailing aecl@utdallas.edu with any questions or if you need further information.
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