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Agilent 4155

September 18, 2023
  • Typical DC test (Ig-Vg, Id-Vg, Id-Vd)
  • DCIV (interface characterization)
  • Time/Sample measurements (BD study)
  • TDDB, TZBD, P/NBTI, HCI

By Cindy Nghe
Posted under Advanced Electrical Characterization

Recent Posts

Welcome to the new Research Core Facilities website!

December 20th

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