Scanning Probe Microscope

Maker: Veeco
Model: Multimode V

Features / Applications:

• “J” Scanner and “E” Scanner
• Topography
• Tapping mode AFM
• Contact mode AFM
• Mechanical Properties
• Lateral Force Microscopy (LFM)
• Force Modulation
• Force-Distance Measurement
• Pico-force Force Spectroscopy
• Electrical and Magnetic
• Magnetic Force Microscopy (MFM)
• Electric Force Microscopy (EFM)
• Scanning Capacitance Microscopy (SCM)
• Tunneling AFM (TUNA)
• Conductive AFM (CAFM)
• Scanning Spreading Resistance Microscopy (SSRM)
• Torsional Resonance Mode (TR Mode)

By Cindy Nghe
Posted under Materials Science