Environmental Scanning Electron Microscope, Beam: 30 keV (W filament), High resolution (3nm)/high vacuum mode, Variable pressure mode (10-3000 Pa) for non-conductive specimen, Detectors: 3 SE, 1 BSD, and an Oxford Explore 30 EDS. Deben peltier cooling stage (-25° to +50°) for wet samples
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Posted under Imaging and Histology